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A number of instruments used in semiconductor, photonics and MEMs fabrication facilities utilize laser interferometers for position control. An error component of the overall repeatability and positioning accuracy concerns the wavelength uncertainty of the laser, since interferometers measure in units of optical wavelength. Interferometrically controlled precision XY stages and other interferometer-based length measurements work much better in vacuum than in air. That's because the optical wavelength of a frequency-stabilized laser fluctuates with changing air density, making measurements that are accurate to a part in ΔL/L~ 107 difficult. This research program aims to deliver better known wavelengths for higher-accuracy interferometry in air.
A Fabry-Perot or ring cavity open to the air where the wavelength of one or more of the modes is known.What are the benefits of a wavelength reference? Higher accuracy than meteorological measurements can provide. Less noise if the index fluctuations within the reference cavity are representative of the interferometer path. Multiple known wavelengths can be supplied, enabling absolute multiple-wavelength interferometry. Allows tunable lasers to be used as interferometry sources. How would a wavelength reference be used? There are a number of ways, for instance a homodyne interferometer might be configured like this:
Or, a heterodyne interferometer might configured using acousto-optic modulators. The laser would most likely be "optically-locked" to the reference cavity. The wavelength reference may be calibrated by femtosecond-comb measurements. In a calibration step (with the cavity in a vacuum chamber) we measure the frequency of a test laser that is locked to a mode. Subsequently, in use in air, the reported wavelength is corrected for
Wavelength references such as these will benefit applications demanding higher accuracy positioning in air, for instance for packaging or repair tasks in the semiconductor or nanotechnology fields. Also, users demanding higher-accuracy length measurements in air will benefit, for instance in the machine-tool or optical fabrication fields.
Further Reading: Search for "wavelength references" in the NIST Time & Frequency Division publications We welcome comments and questions:richard.fox(at)nist.gov | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||