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Atomic Vapor Cells with Improved Long-term Frequency Stability
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A novel technique for
microfabricating alkali atom vapor cells is described, in which alkali atoms
are evaporated into a micromachined cell cavity through a glass nozzle. A
cell of interior volume 1 mm3, containing 87Rb and a
buffer gas, was made in this way and was integrated into an atomic clock
based on coherent population trapping. A fractional frequency instability of
6 × 10-12 at 1000 s of
integration time was measured. The long-term drift of the F=1, mF
= 0 → F=2, mF = 0 hyperfine frequency of atoms in these cells is
below 5 × 10-11 / day. This
high stability results from an improvement of both the linear frequency
drift and temperature-related effects. The measurements presented here show
that it is possible to reach long-term stabilities below 10-11 at
1 hour of integration in microfabricated cells. This makes chip-scale atomic
clocks a viable technology for applications that require small size and low
power consumption in combination with long-term frequency stability.
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Novel filling method for chip-scale
alkali vapor cells. (a) The silicon and glass preform and the cover
glass are baked at 300 °C inside the vacuum chamber. (b) The mixture
of barium azide and alkali chloride is reacted inside a glass
ampoule to create barium, chlorine, alkali atoms, and nitrogen; the
nitrogen is pumped away. (c) The alkali atoms are diffused through
the glass nozzle into the cell preform. (d) The chamber is filled
with a combination of buffer gases. The cover glass is anodically
bonded to the silicon preform at a temperature of 300 °C and with
200 V applied across the sample. |
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Fractional frequency
instability measured in the Cs D2 CSAC (squares) and the cell made
with the
and
the clock using the cell made with the new evaporation method, based
on the D1 line of 87Rb (triangles). |
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References:
S. Knappe, V. Gerginov, P. Schwindt, V. Shah, L. Hollberg and J. Kitching, "Atomic
vapor cells for chip-scale atomic clocks with improved long-term frequency
stability," Opt. Lett. 30, 2351 (2005).